ISO 15632 defines the most important quantities that characterize an energy dispersive X-ray spectrometer (EDS) consisting of a semiconductor detector, a pre-amplifier and a signal processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid state ionization. It specifies minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM). Realization of the analysis is outside the scope of this International Standard.
Status: WithdrawnPublication date: 2002-12
Edition: 1Number of pages: 8
Technical Committee: ISO/TC 202 Microbeam analysis
ISO 15632:2002Stage: 95.99
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