International Standard
ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Reference number
ISO 21222:2020
Edición 1
International Standard
Vista previa
ISO 21222:2020
No disponible en español
Publicado (Edición 1, 2020)

ISO 21222:2020

ISO 21222:2020
CHF 96
Convertir Franco suizo (CHF) a tu moneda


This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

Informaciones generales

  •  : Publicado
     : 2020-01
    : Norma Internacional publicada [60.60]
  •  : 1
     : 17
  • ISO/TC 201/SC 9
  • RSS actualizaciones

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)