International Standard
ISO 15932:2013
Microbeam analysis — Analytical electron microscopy — Vocabulary
Reference number
ISO 15932:2013
ISO 15932:2013
Edición 1
2013-12
2013-12
© ISO 2024
International Standard
Resumen
ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2013-12Etapa: Norma Internacional en proceso de revisión sistemática [90.20]
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Edición: 1Número de páginas: 21
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Comité Técnico :ISO/TC 202/SC 1
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