ISO 24688:2022
p
ISO 24688:2022
79454

Status : Published

en
Format Language
std 1 63 PDF + ePub
std 2 63 Paper
  • CHF63
Convert Swiss francs (CHF) to your currency

Abstract

This document specifies the substrate conditions and testing of the modulation period (including the principles for low-angle X-ray methods, the requirements of the coatings, the requirements for X-ray measuring apparatus, the calibration of apparatus and samples, and the testing conditions and calculation process) of nano-multilayer coatings by low-angle X-ray methods including X-ray reflectivity (XRR) and glancing incident X-ray diffraction (GIXRD).

Read sample 

Preview this standard in our Online Browsing Platform (OBP)

General information

  •  : Published
     : 2022-07
    : International Standard published [60.60]
  •  : 1
     : 8
  • ISO/TC 107/SC 9
    25.220.01 
  • RSS updates

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)