ISO 21222:2020
ISO 21222:2020



This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

General information 

  •  :  Published
     : 2020-01
  •  : 1
     : 17
  •  : ISO/TC 201/SC 9 Scanning probe microscopy
  •  :
    71.040.40 Chemical analysis

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