This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
Status: PublishedPublication date: 2020-01
Edition: 1Number of pages: 17
Technical Committee: ISO/TC 201/SC 9 Scanning probe microscopy
- ICS :
- 71.040.40 Chemical analysis
This standard contributes to the following Sustainable Development Goal:
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|std 2 92||Paper|
ISO 21222:2020Stage: 60.60
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