This document specifies methods for characterizing and calibrating the scan axes of scanning-probe microscopes (SPMs) for measuring geometric quantities at the highest level. It is applicable to those providing further calibrations and is not intended for general industry use, where a lower level of calibration might be required.
This document has the following objectives:
— to increase the comparability of measurements of geometrical quantities made using SPMs by traceability to the unit of length;
— to define the minimum requirements for the calibration process and the conditions of acceptance;
— to ascertain the instrument's ability to be calibrated (assignment of a "calibrate-ability" category to the instrument);
— to define the scope of the calibration (conditions of measurement and environments, ranges of measurement, temporal stability, transferability);
— to provide a model, in accordance with ISO/IEC Guide 98-3, to calculate the uncertainty for simple geometrical quantities in measurements using an SPM;
— to define the requirements for reporting results.
Status: PublishedPublication date: 2019-05
Edition: 2Number of pages: 58
Technical Committee: ISO/TC 201/SC 9 Scanning probe microscopy
- ICS :
- 71.040.40 Chemical analysis
This standard contributes to the following Sustainable Development Goal:
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|std 1 187||PDF + ePub|
|std 2 187||Paper|
ISO 11952:2019Stage: 60.60
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