Status : Published (Under review)

This standard was last reviewed and confirmed in 2023. Therefore this version remains current.
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Abstract

ISO 19840:2012 specifies a procedure for the verification of dry-film thickness against nominal dry-film thickness on rough surfaces, including the adjustment of the instruments used, the definition of inspection areas, sampling plans, measurement methods and acceptance/rejection criteria.

The procedure is based on the use of instruments of the permanent magnet, electromagnet and eddy current type. Instrument accuracy is verified both at zero and at a known thickness on a smooth surface and adjusted if necessary.

It does not apply to nominal dry-film thicknesses less than 40 µm.

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General information

  • Status
     : Published
    Publication date
     : 2012-09
    Stage
    : International Standard confirmed [90.93]
  • Edition
     : 2
    Number of pages
     : 16
  • Technical Committee :
    ISO/TC 35/SC 14
    ICS :
    87.020 
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