ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.
Status: WithdrawnPublication date: 2004-09
Edition: 1Number of pages: 10
Technical Committee: ISO/TC 202/SC 2 Electron probe microanalysis
- ICS :
- 71.040.99 Other standards related to analytical chemistry
ISO 17470:2004Stage: 95.99
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