ISO 18118:2004 gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Status: WithdrawnPublication date: 2004-05
Edition: 1Number of pages: 23
Technical Committee: ISO/TC 201/SC 7 Electron spectroscopies
- ICS :
- 71.040.40 Chemical analysis
ISO 18118:2004Stage: 95.99
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