The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
Status: WithdrawnPublication date: 1993-08
Edition: 1Number of pages: 3
Technical Committee: ISO/TC 171/SC 2 Document file formats, EDMS systems and authenticity of information
- ICS :
- 37.080 Document imaging applications
ISO 6342:1993Stage: 95.99
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