Filtrar :
| Norma o proyecto bajo la responsabilidad directa de ISO/TC 202/SC 1 Secretaría | Etapa | ICS |
|---|---|---|
|
Microbeam analysis — Analytical electron microscopy — Vocabulary |
90.20 | |
|
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary |
40.60 | |
|
Microbeam analysis — Scanning electron microscopy — Vocabulary |
95.99 | |
|
Microbeam analysis — Scanning electron microscopy — Vocabulary |
90.60 | |
|
Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary |
20.00 |
|
|
Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary |
30.98 | |
|
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
95.99 | |
|
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
90.60 |
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